Posted by Staff, ATP Electronics

Signal Processing Applications

White Paper

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DRAM Modules are a crucial determining factor in server reliability. Defective DRAM modules during the service life corrupt data and can cause systemwide server downtime. The slightest amount of down time translates into millions of dollars of loss in revenue. ATP has recently incorporated its patent pending Test During Burn In (TDBI) System, Supervisory Control and Data Acquisition (SCADA) System, and the Automatic Test Equipment (ATE) into one sophisticated system. The two combined testing capabilities are intended to provide extended long-term quality and reliability of ATP industrial grade DRAM modules.

There are generally two other categories of mass-production-scale burn-in systems on the market, the conventional large thermal chambers and other proprietary tests. In Comparison to these systems, the unique advantages of the ATP TDBI and ATE combined systems are highlighted in this white paper.[Continue reading →]

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